Lifetime Testing and In-Situ Condition Monitoring of PCB Embedded Silicon Carbide MOSFETs

This work explains step by step how to realize a setup for lifetime testing using active power cycling for power transistors with a special focus on PCB-embedded SiC-MOSFETs. For further analysis of the health status of the module, in-situ condition monitoring in form of acoustic emission testing is used for a better understanding of the failure mechanisms.