Simplified modeling method of EMC macro model for estimation of EMI from DC-DC converter

To demonstrate that EMC performance is equivalent before and after the replacement of components, it is effective to perform simulations using models of ICs as noise sources. The authors have proposed a macro model for estimating EMI (Electromagnetic Interference) of ICs by applying the conducted emission test method, but errors between the model and measurements have been a problem. In this study, the authors have investigated a modeling method to eliminate the effect of switching jitter during modeling and compared the results with actual measurements. The calculated results showed almost as same characteristics as the measured results and suggested the effect due to the exclusion of jitter in the modeling appears in the levels of harmonic components.