ASAP: Accelerating Corner-Based Timing Analysis with Bayesian Active Self-Attention Neural Process

With the advancement of modern nanoscale technology nodes, Static Timing Analysis (STA) has become an indispensable technique for ensuring circuit reliability and performance across diverse process conditions. However, traditional STA methods scale poorly to the explosion of process corners in the nanoscale fabrication technology. Despite some seminal works in using AI to accelerate such processes, they either lack reliability or stability. To this end, we introduce ASAP, a novel approach addressing this challenge by combining both the latest deep learning methods and the classical Bayesian models to deliver scalable and accurate predictions with a self-calibration strategy to ensure reliability. Technically, the ASAP novelly integrates self-attention to help identify and prioritize crucial features under various input conditions and employs Neural Process to make confidence-based predictions for the final timing results. Furthermore, ASAP is equipped with Active Learning for self-refinement and self-correction. Experimental evaluations on benchmark circuits demonstrate that our method surpasses state-of-the-art work in STA accuracy by 18% in terms of prediction accuracy.