Systematic Analysis of an Innovative DDR5 Connector Design

This article presents the systematic analysis of an innovative double data rate fifth-generation (DDR5) synchronous dynamic random-access memory connector design for motherboard applications. Building on component-level improvements, this article addresses challenges encountered during system integration. The gold finger stub length was adjusted from 2.16 to 0.46 mm, ensuring mechanical robustness while enhancing electrical performance. Simulations were conducted to evaluate the effects of this modification on DDR5’s total radiated power (TRP), insertion loss (IL), return loss (RL), and eye diagram analysis within a desktop motherboard setup. Practical tests, such as memory stability testing with MemTest on various motherboard configurations, validated the predicted improvements. The proposed design achieved stable operation at up to 9000 mega transfers per second (MT/s) for DDR5-8800 modules, demonstrating a 400–500 MHz improvement across all tested configurations. These findings bridge the gap between component-level and performance under system integration, providing meaningful guidance for improving DDR5 system efficiency and signal integrity in next-generation high-performance computing systems.