A Test Response Systolic Compression Method Based on Compressed Sensing

This article presents a novel method for compressing test responses based on scan fault response matrices. The primary goal is to minimize the amount of test response data by constructing a scan fault response matrix and implementing a systolic compression approach. This method aims to address the degradation in fault detection that can occur due to compression, ultimately resulting in a reduced test response dataset and improved fault coverage. To achieve this, we define a scan fault response matrix according to the characteristics of the test response data and propose a custom processing structure using systolic matrices. The compression time is reduced through parallel processing. The scan fault response matrix is automatically generated using the test pattern and temporarily stored, which helps to minimize area overhead. Experimental results demonstrate that this method achieves a higher compression ratio and fault coverage, reduces test compression time, and minimizes hardware overhead.