Scattering Parameter Measurement System Using Probes for Surface Mount Devices Operating in the Frequency Range from 50 kHz to 1 GHz

This paper presents a new probe system for measuring the scattering parameters of surface mount devices (SMDs) in the frequency range from 50 kHz to 1 GHz. This system addresses the high demand for power devices operating at high-switching frequencies; thereby facilitating the downsizing of power electronic circuits. The measurement of the scattering parameters of power devices, including the parasitic elements of the packages, is a prerequisite step in realizing the high-switching frequency operations. Therefore, probes with a pitch of 3.7 mm between the signal and ground tips and a probe station for controlling the probes were manufactured as original components. Using a commercially available vector network analyzer, a source/measure unit, and bias-tees in addition to the developed components, the scattering parameters with a dc bias applied are conveniently measured. The advantage of the proposed system is that the probes can directly contact an SMD under test, and no test fixture is required to establish a connection between a device under test and the test port. Moreover, a single type of probe can contact multiple types of SMDs under test. This is a pioneering measurement system for SMDs in power electronics operated at radio frequencies.