Evaluating the Impact of Single Event Effect Duration on Quantum Circuits

Quantum computing offers revolutionary potential for data processing and the efficiency of information systems. This work investigates the impact of the Single Event Effect (SEE) duration on quantum circuit outputs using the Quantum Fault Injector (QuFI) and the Quantum Vulnerability Factor (QVF). We evaluate four distinct well-known quantum circuits, including the Bell circuit, to determine the probability of faults impacting the results and to understand the impact of these faults on the number of shots performed. After 270,336 injected faults in qubits, the results demonstrate significant variations in the robustness of the analyzed circuits, and it becomes evident that injections in θ (Theta) tend to have a more significant impact on the final output, highlighting the importance of metrics like QVF for the development of reliable quantum systems.