A Survey of Lifetime Extension Techniques for High-Reliability Power Electronics

The lifetime of power converters is crucial for the reliability of power electronic systems. Long term exposure to severe thermal stress can lead to cumulative fatigue failure in semiconductor devices and DC-link capacitors. Active thermal control through software optimization of control algorithms has been extensively investigated to mitigate power loss and extend component life. This article aims to provide a comprehensive analysis of state-of-the-art lifetime extension control of power converters. A review of the current status of failure mechanisms and failure criteria will be provided, and technology surveys of lifetime estimation will be detailed. Also, a comparison of lifetime extension control strategies for different converters is carried out.