Real-Time Evaluation Method for Single Event Effects in High-Speed Digitized RF Data

This paper presents a method to evaluate single event effects (SEE) on analog to digital converters (ADCs) and digital to analog converters (DACs) in real-time and operated at high speed. The presented approach is designed for SEE testing on highly integrated radio frequency integrated circuit devices that combine ADCs, DACs and numerous RF parts such as amplifiers, mixer stages, filters and synthesizers.