SAMIC: Segment Anything Model for Integrated Circuit Image Analysis

Circuit annotation is crucial in analyzing integrated circuit (IC) images for hardware assurance. While deep learning algorithms perform well in circuit annotation, they are highly reliant on labeled training data, which are extremely costly to obtain. The Segment Anything Model (SAM) excels in segmenting natural images but performs sub-optimally on IC images due to the domain gap between IC images and natural images. In this paper, we introduce SAMI C which extends the application of SAM for effective annotation of IC images. We curated an extensive dataset of IC images from four different devices and developed a novel training methodology for SAM models in IC image segmentation. Our experiments show that SAMIC outperforms the original SAM model by 36.78 % and improves accuracy by 6.35 % compared to the second-best technique.