A New Short-Shim-Thru Calibration Method to Replace SOLT in Waveguide Measurement Systems

In this article, we propose a new short-shim-thru (SST) calibration method for effectively calibrating vector network analyzers (VNAs) in waveguide measurement systems. The proposed SST calibration method exhibits lower measurement uncertainty across all scattering parameter values than the SOLT calibration method. Moreover, the SOLT calibration method requires seven measurements of calibration standards for the two-port network calibration, whereas the proposed SST calibration method requires only four measurements, which makes the process easier.