Method for Determining Optimum Time in Time-Domain Stop-and-Go Active Gate Driving

A method for determining the optimum time in time-domain stop-and-go active gate driving (TD AGD), which changes the gate driving strength three times from “strong to high-Z to strong”, is proposed. In the double pulse tests of IGBT at 600 V, compared with the conventional gate driving, the proposed TD AGD reduces the switching loss by 25% and 18% at load currents of 50 A and 100 A, respectively, under collector current overshoot-aligned conditions.