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PEPL: Precision-Enhanced Pseudo-Labeling for Fine-Grained Image Classification in Semi-Supervised Learning | IEEE Conference Publication | IEEE Xplore

PEPL: Precision-Enhanced Pseudo-Labeling for Fine-Grained Image Classification in Semi-Supervised Learning


Abstract:

Fine-grained image classification has witnessed significant advancements with the advent of deep learning and computer vision technologies. However, the scarcity of detai...Show More

Abstract:

Fine-grained image classification has witnessed significant advancements with the advent of deep learning and computer vision technologies. However, the scarcity of detailed annotations remains a major challenge, especially in scenarios where obtaining high-quality labeled data is costly or time-consuming. To address this limitation, we introduce Precision-Enhanced Pseudo-Labeling (PEPL) approach specifically designed for fine-grained image classification within a semi-supervised learning framework. Our method leverages the abundance of unlabeled data by generating high-quality pseudo-labels that are progressively refined through two key phases: initial pseudo-label generation and semantic-mixed pseudo-label generation. These phases utilize Class Activation Maps (CAMs) to accurately estimate the semantic content and generate refined labels that capture the essential details necessary for fine-grained classification. By focusing on semantic-level information, our approach effectively addresses the limitations of standard data augmentation and image-mixing techniques in preserving critical fine-grained features. We achieve state-of-the-art performance on benchmark datasets, demonstrating significant improvements over existing semi-supervised strategies, with notable boosts in accuracy and robustness.
Date of Conference: 06-11 April 2025
Date Added to IEEE Xplore: 07 March 2025
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Conference Location: Hyderabad, India

References

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