Optical Frequency-Filtered Surface Plasmon Resonance Microscopy for Improved Image Precision

Surface plasmon resonance microscopy (SPRM) utilizes plasmon resonance for label-free imaging. In this study, noise associated with reflection at the metallic interface was effectively suppressed with a spatial filter to enhance acquired image precision. The filtering process and its impact on image precision were analyzed, demonstrating that Fourier domain filtering offers a promising solution to address the current limitations of SPRM imaging, especially the significant image degradation caused by noise from reflected light.