Decoupled Prototype Learning for Reliable Test-Time Adaptation

Test-time adaptation (TTA) is a task that continually adapts a pre-trained source model to the target domain during inference. One popular approach involves fine-tuning model with cross-entropy loss according to estimated pseudo-labels. However, its performance is significantly affected by noisy pseudo-labels. This study reveals that minimizing the classification error of each sample causes the cross-entropy loss's vulnerability to label noise. To address this issue, we propose a novel Decoupled Prototype Learning (DPL) method that features prototype-centric loss computation. First, we decouple the optimization of class prototypes. For each class prototype, we reduce its distance with positive samples and enlarge its distance with negative samples in a contrastive manner. This strategy prevents the model from overfitting to noisy pseudo-labels. Second, we propose a memory-based strategy to enhance DPL's robustness for the small batch sizes often encountered in TTA. We update each class's pseudo-feature from a memory in a momentum manner and insert an additional DPL loss. Finally, we introduce a consistency regularization-based approach to leverage samples with unconfident pseudo-labels. This approach transfers feature styles of samples with unconfident pseudo-labels to those with confident pseudo-labels. Thus, more reliable samples for TTA are created. The experimental results demonstrate that our methods achieve state-of-the-art performance on domain generalization benchmarks, and reliably improve the performance of self-training-based methods on image corruption benchmarks.