Evaluation of X-Ray Irradiation Effects on Solid Polymer Electrolyte Memristor Devices

In this study, we present the impact of irradiation on the memristive properties of solid polymer electrolyte memristor devices with a Ti/PMA/PEO/PMA/(Ti or Au) structure. The devices were measured before irradiation and after 1 krad and 2 krad total doses. The effects of irradiation appear to be an improvement in both conductance and hysteresis after the first 1 krad dose, and a destruction of hysteresis (the Au bottom device) or conductance (the Ti bottom devices) after the second dose.