Statistical Analysis of Historical SEL Test Data to Provide a Priori Risk Estimates for Use of Unhardened CMOS Parts

Single-event latchup (SEL) is a serious obstacle to the use of state-of-the-art microelectronics in space systems, and a priori prediction of SEL susceptibility has proved elusive. We develop SEL risk-assessment tools based on the analysis of large archives of SEL test data for unhardened complementary metal-oxide–semiconductor (CMOS) parts. Results include a flexible method for bounding SEL rates even with minimal test data.