Overview of Major Challenges and Applications for Vector EMI Scanner System

An overview of near-field scanning techniques utilized for EMC applications to map electromagnetic fields and to localize EMI sources is presented. The distinction between a classical antenna scanner and a vector EMI scanner system is defined. General applications of vector near-field data are discussed when the scanning surface is located in a close proximity to the radiating object. Major challenges in hardware and software system development are presented and fundamental limitations of this measurement technique are emphasized.