A Sensitivity Calibration Method for Induction Magnetic Sensors Based on TEM Cell

A Sensitivity Calibration Method for Induction Magnetic Sensors Based on Transverse Electromagnetic Wave CELL is proposed to address the shortcomings of traditional calibration methods for Induction Magnetic Sensors in terms of frequency, shielding, and space. By utilizing the transmission characteristics of TEM CELL and the ease of obtaining voltage type signal instruments, a new calibration system is constructed and compared with the test data of traditional calibration systems to verify the feasibility of the method.