'I have a dream', thoughts about future ATE instruments

Requirements for an intelligent instrument in an automatic test equipment (ATE) used for functional test of printed-board assemblies are described. Problems of compatibility with different versions of old and new instruments are discussed. The future demands for intelligent instruments are analyzed, and some recommendations are presented. Suggestions on how to implement a command-file structure in instruments for handling more advanced bus instructions, including execution of complete used-specified test sequences in the instrument itself, are proposed. Methods of integrating the intelligent instruments into an ATE environment are presented. Future needs for a standard for remote sensors and drivers for instruments in an ATE are presented.<
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