Exhaustive Application-Dependent Testing for FPGA Interconnect Resources

Up to now, in the field of application-dependent testing for FPGA interconnect resources, the most widely used method is single-term function method, and the most accurate fault model is asymmetric bridging fault model. In this paper, a new fault model called Boolean bridging fault model is proposed, which is a superset of asymmetric bridging fault model. Based on single-term function method, we minimize the number of test configurations to the greatest extent possible, and theorems in set theory ensure that the result is optimal for both asymmetric bridging fault model and Boolean bridging fault model. Moreover, for special cases called feedback bridging faults, the study demonstrates that repeated sampling is a simple method that can achieve high coverage.