Over-the-Air Diagnosis of 1-Bit RIS Based on Amplitude-Only Measurement

Reconfigurable intelligent surfaces (RISs) have demonstrated their potential to manipulate properties of radio waves for many applications. Over-the-air (OTA) diagnosis of RISs is essential to ensure their proper radiation characteristics. In this work, we propose a novel OTA diagnosis method for 1- bit RIS based on amplitude-only measurements. The proposed algorithm is also experimentally validated with a single-probe setup in an anechoic chamber, where all RIS faulty elements can be correctly detected based on phaseless measurements. The proposed method is experimentally demonstrated to be highly efficient, cost-effective and effective. The proposed method is significant for RIS characterization, as it ensures the optimal performance and reliability of RIS systems across various applications.