A Methodology for Extracting a Broadband Small-Signal Model of InP DHBT from 0.2 to 220 GHz

A methodology is proposed for extracting a broadband small-signal model of InP DHBT from 0.2 to 220 GHz, aiming specifically at terahertz (THz) applications. The intrinsic part adopts a π topology, directly extracted from the de-embedded data below 67 GHz. The high frequency data is obtained after on-wafer TRL calibration. Considering the partial interconnection coupling in the device test data after TRL calibration, parasitics of interconnection coupling are taken into account in the model topology. The corresponding extraction method is provided for each parameter. Based on the proposed model topology and extraction method, a comparison between test values and simulated values demonstrates good agreement within the range of 0.2-220 GHz.