Monostatic Measurement Setup and Transformation Method to Obtain Bistatic Reflection Patterns of Reconfigurable Intelligent Surfaces

To verify the proper working of a Reconfigurable Intelligent Surface (RIS), similar to antenna radiation patterns, the RIS reflection pattern has been established as key performance indicator. To overcome the necessity of a bistatic RIS qualification setup, where two antennas at different positions are used, this paper presents a novel measurement approach to obtain the RIS reflection pattern based on a monostatic indirect Far-Field (FF) Compact Antenna Test Range (CATR) setup. Due to the monostatic principle, only one antenna, which is used for transmission and reception, is required. Subsequently, the mono-static reflection patterns are transformed into bistatic reflection patterns by applying different Monostatic to Bistatic Equivalence Theorems (MBETs) known from radar-cross-section theory. With that, the required setup can be simplified in terms of mechanical complexity, setup footprint and the number of measurement scenarios, since incident and reflection angle correspond in the monostatic case. This paper analyzes three different MBETs, namely Kell, Crispin/Siegel and Falconer, with respect to their suitability for RIS reflection pattern measurements. Moreover, a monostatic CATR test environment is presented and two metal plate based RIS calibration approaches are introduced. This novel monostatic RIS measurement approach is validated with simulation and measurement data of two mmWave fixed beam RISs. Both of them are reflecting an impinging signal from broadside $(\theta=0^{\circ})$ direction into $47^{\circ}$ at a center frequency of 27 GHz. The results prove the suitability of this approach.