Detector Mismatch Correction for the Calibration-Independent and Position-Insensitive Transmission/Reflection Method

Classic methods for extracting material character-istics typically demand rigorous calibration, multiple samples, precise location measurements, etc. A recent research effort led by Zhao Caijun, Jiang Quanxing, and Jing Shenhui utilized a simple transmission/reflection method to extract high accuracy permittivity results from a Coaxial Line system. This method uses two uncalibrated scattering parameter measurements: one of the empty fixture and one of the sample at a single position. This paper extends the method to produce accurate permittivity results from a Rectangular Waveguide system once corrected for detector mismatch.