Correlation of High Energy Proton and Atmospheric Neutron Destructive and Non-Destructive Single-Event Effect Tests of a 1200V SiC MOSFET

We present the correlation of high energy proton and atmospheric neutron single-event test results on a recent 1200V SiC MOSFET, obtained with destructive and non-destructive methods. The correlation of the results is discussed, showing a good agreement between both methods. TCAD modelling is used to investigate the failure mechanisms.