Scan-Based Radiation Test Method Using SRAM Dosimeter for Beam Characterization

We performed single-event effect (SEE) tests by scanning a static random access memory (SRAM)-based dosimeter along both horizontal and vertical axes, in small discrete steps, in the beamline to characterize fluence spatial uniformity across the beam active area. The dosimeters were designed and populated with 41 SRAM devices mounted in the diamond-shaped configuration that covers the beam’s entire active area. Radiation tests were carried out at the Irradiation of Chips and Electronics (ICE-II) House at the Los Alamos Neutron Science Center (LANSCE) to measure neutron beam spatial profile, intrinsic error rate of individual devices, and device-to-device SEE variability among all the samples on the dosimeter. Test and analysis procedures are developed to isolate the measurement error in cross section or error rate calculation attributed to variations in fluence spatial uniformity and device-to-device variability. The proposed test method and presented results may benefit the radiation test engineers to conduct radiation testing with improved efficiency and accuracy by reducing the measurement error for simultaneous irradiation of multiple devices.