Research on the Change of Resistance of CrNi Thin-Film Resistor During Accelerated Climate Testing

This study examined the change in resistance after 1000 hours of accelerated temperature testing at various temperatures for $\mathbf{C r N i}$ thin-film resistors. Using the Arrhenius equation and its variations to calculate the change in resistance of CrNi resistors produced with different manufacturing technologies, the calculation results show that the resistance change after 1000 hours at high temperature, for resistors made with advanced technologies and higher measurement reliability, is about 8 times lower than that of resistors with lower measurement reliability.