Development of a Half-Bridge Cell-Derived All-Inclusive Conducted Emission Noise Model for SiC-Based Single Phase Boost PFC Converter

This work presents a novel all-inclusive power electronic converter noise model comprised of both differential-mode (DM) and common-mode (CM) parasitic circuit components. Furthermore, a thorough modeling method and novel experiment-driven methodology to analyze the impact of the DM and CM circuit components on the resultant conducted emission electromagnetic interference in a single-phase power factor correction boost converter rated for 1 kW 120 VAC/400 VDC utilizing silicon-carbide mosfets is presented. This is achieved by predicting DM and CM noise corner frequencies and observing DM/CM noise corner frequencies in a novel half-bridge noise cell-based, all-inclusive converter parasitic circuit model. Frequency spectrum results find that eight DM noise corner frequencies are estimated by the proposed all-inclusive noise model with low average error of 6.45%, and the model further successfully identifies lumped CM capacitances present in the power converter system.