Computation of Spot Diagrams and Ray Tracing of Different Aberrated Beams Using Geometrical Exact Ray Tracing

Aberrations are imperfections in optical systems, particularly lenses, that cause deviations from ideal image formation. They signify inaccuracy in performance from the predictions made by the paraxial approximation within the lens or optical system. Therefore, the measurement of various aberrations within the lens or optical system is essential for image analysis. Here, we will incorporate the concept of spot diagrams which are the intersection coordinate points of rays in the image plane of the lens system. This paper presents our research employing the geometrical exact ray tracing method, a tool suited for computing spot diagrams of several common monochromatic aberrations. Furthermore, we apply the same method to gain insights into chromatic aberrations.