RF Characterization and Analysis of Low-Loss PCB Material and Transmission Line Up to 110 GHz

In this work, the dielectric properties (relative dielectric constant, εr and loss tangent, tanδ) of a low loss PCB material developed by The Chemours company are extracted using metallized and non-metallized dielectric characterization methods at mmWave frequencies. The εr and tanδ of a 65 μm non-metallized film, measured using a Fabry-Pérot open resonator method are 2.35 and 0.0022 respectively at 76.93 GHz. Microstrip ring resonators are used to extract ε r and tanδ of metallized material at 28 GHz as 2.245 and 0.0022 respectively. Using the extracted values, electromagnetic modeling and simulation of a Grounded Coplanar Waveguide (GCPW) were performed. The simulated GCPW is fabricated and measured. The measurements show that the GCPW fabricated on the Chemours material has a maximum insertion loss of 2 dB for a 29 mm Line at 110 GHz. Very good correlation is observed between simulated and measured results.