A Sequential Probability Ratio Based Lifetime Prediction Method for Electronic Systems

The lifetime prediction of electronic systems is of utmost significance and holds a crucial position. Sequential probability ratio (SPR), as a statistical approach, is employed in sequential analysis for making decisive judgments. Here, a novel life prediction method based on sequential probability ratio is put forward. This method specifically addresses the issue that relying on a single parameter alone is not comprehensive enough, and thus, it integrates multiple health degrees. The experimental outcomes clearly demonstrate the efficacy and validity of this method.