Parameter Extraction of Diode RIS Elements Based on the Waveguide Equivalent Test Method

This study delves into the parameter extraction of diode RIS (Reconfigurable Intelligence Surface) array elements using the waveguide equivalent test method. An infinite periodic RIS array environment was constructed using waveguide equivalent simulation methods, enabling rapid acquisition of amplitude and phase information for diode-controlled RIS unit devices. Comparing the simulation data with the fitting results reveals a high degree of consistency, which validates the scientific and effective nature of the proposed method and provides a solid theoretical foundation and a cost-effective practical validation scheme for subsequent diode parameter extraction and RIS array design. (Abstract)