NUIST Near-Field Scanner System Design for RF and Microwave EMC Test

A near-field (NF) scanner (NFS) was designed recently at NUIST electromagnetic compatibility (EMC) lab. The developed NFS design engineering is described in the present paper. The test bench system is automated by using LabVIEW command interface. The electromagnetic (EM) probe is moved along the surface scanning of the electronic device under test (DUT). Efficient results of magnetic field cartography with two different scanning techniques using passive microstrip DUT VNA and using STM32 digital board with spectrum analyzer are presented. The NFS is used in the future for the 6G printed circuit board EMC testing.