Two-Dimensional Quantum Material Identification via Self-Attention and Soft-Labeling in Deep Learning

Detecting two-dimensional (2D) materials in silicon chips presents a significant challenge in the field of quantum machines due to the difficulty of data collection. Specifically, among thousands of flakes, not all flakes are useful or well-annotated, resulting in noisy and hard samples within the dataset, which challenges the deep neural network (DNN) to learn. To address this problem, we propose a novel method for identifying quantum 2D flakes even when there is a high rate of missing annotations in the input images. In particular, we first propose a new mechanism for automatically detecting false negative flakes that are missing annotations. Second, we introduce an attention-based loss function to mitigate the negative impact of these unannotated flakes on the DNNs. The experimental results demonstrate that our method outperforms previous approaches.