Simulation study on the defect detection for the epoxy insulators via the infrared thermal imaging

This research provides a simulation process for detecting the defect of air cavities with various size in epoxy insulator plates using the infrared thermal wave technology. The results shows that the defect diameter impacts both surface temperature magnitude and the cooling rate, while defect depth influences surface temperature magnitude as well as the temporal occurrence of surface temperature deviation from that of the defect-free surface. The defect identification methods and the discerned influence of defect parameters proposed in this study have practical value and can stand as a theoretical basis for subsequent field experiments.