Design of Function Test System for System on Chip Based on Automatic Test Equipment

In order to improve the efficiency of system-on-chip (SoC) functional testing (FT) and mass production testing and improve the performance of the test system, this paper makes some improvements and innovations based on the common FT system in the market. By using SPI bus and asynchronous communication technology between ATE and DUT, parallel testing between ATE and DUT is realized by setting command decoding controller, memory controller and data temporary storage area, so as to reduce test communication waiting time and improve test efficiency.