Physically Unclonable Characteristics for Trapped Ion Quantum Processors

At the forefront of quantum technology, trapped ion quantum computing offers unparalleled prospects for computation and data processing. This paper proposes securing trapped ion computing hardware with physically unclonable characteristics (PUCs), leveraging fabrication-induced device variations. We review Sandia's High Optical Access trap and IonQ's Iris trap processors, suggesting potential PUC characteristics for evaluation. We also present our experimental methodology and preliminary results using calibration data (SPAM error, 1Q, and 2Q errors) and results from benchmarking algorithms (Single Qubit State Fidelity and Hadamard Quantum Walks) as characteristics. Our findings indicate that, except for 2Q errors, calibration data characteristics lack promise as PUCs due to low variation. In contrast, benchmarking algorithms, particularly the Single Qubit State Fidelity, the 2-, 3-, and 5-qubit, 1-step Hadamard Walk, and the 5-qubit, 10-step Hadamard Walk show potential as PUC characteristics due to their high variation.