An Integrated Miniaturized VNA for On-Chip PA Mismatch Measurement

This paper presents an embedded reflectometer for power amplifier output mismatch measurement. The proposed system is implemented in 28-nm CMOS technology. It consists of two back-to-back directional couplers, two mixers for incident and reflected signal measurements, and finally two Peak Power Detectors for peak voltage measurement. Simulations reveal very good accuracy, with magnitude and phase errors below 0.29 dB and
$1.6^{\circ}$
respectively, while maintaining a compact area of 0.85
$\mathbf{mm}^{2}$
with a power consumption of only 3 m W.