Prediction of Yield in Functional Testing of Motherboards in Laptop Manufacturing

Functional testing stands as a pivotal quality control step in the production process of laptop motherboards, aiming to validate the proper functioning of various components. However, due to the multitude of functional modules involved on the motherboard, testing all of them requires a significant amount of time and resources. As a result, production line engineers often rely on empirical selection of modules with low yield rates for testing. However, such empirical yield estimation is often inaccurate. To address this challenge, this study proposes a hybrid model based on XGBoost and Long Short-Term Memory (LSTM) networks to predict the yield of each functional module. By harnessing the feature learning capability of XGBoost and the sequential modeling power of LSTM, this model efficiently explores the intricate correlations among motherboard functional modules, thereby accurately forecasting their yields. We extensively train and validate the model using historical production data and successfully deploy it on real laptop motherboard production lines. Experimental results demonstrate that our hybrid model accurately predicts the yield of each functional module, providing crucial guidance for the functional testing process. Through in-depth analysis of the predicted yield results, engineers can systematically choose testing projects to save time and resources. This research offers a novel approach and pathway for enhancing motherboard production efficiency and quality.