Functional Test-Cost Reduction Based on Optimization Modeling and Congestion Control

Functional testing is a crucial process to guarantee the quality of electronic products. In recent years, the cost of functional testing has been rising with the increasing complexity of products, and reducing testing costs is of great significance to the economic efficiency of electronic manufacturing enterprises. Related research has not yet fully considered the issue of the non-uniform distribution of functional testing samples in practical applications, making it challenging to ensure the effectiveness of reducing testing costs. Motivated by the concept of TCP congestion control algorithms, this article presents an enhanced congestion control algorithm tailored for the functional testing process and proposes a method to reduce testing costs accordingly. The proposed method can design dynamically changing testing strategies based on optimal modeling. On the simulation data closely resembles the actual data, the proposed method can significantly reduce the testing costs compared to the pure optimization modeling method.