Functional Test-Cost Reduction Based on Fault Tree Analysis and Binary Optimization

With the rapid increase in the complexity of electronics, the cost of the functional testing process used to ensure product functionality continues to rise. Optimization modeling based on reliability analysis is an effective approach to reduce testing costs. However, the reliability calculations of existing methods often exhibit significant deviations, making it challenging to guarantee the effectiveness of the resulting testing strategies in practical applications. To address this issue, this article proposes an optimization modeling method that integrates statistical analysis and reliability analysis. The expression for the reliability of the system’s key stage is formulated by analyzing the system’s reliability. Statistical analysis is utilized to exploit the inherent reliability information in the enormous process data to determine the probability of the root causes of system failures. The reliability of the key stage is quantitatively calculated based on the structure of the fault tree tailored for the system. On this basis, a binary optimization model is established to obtain a testing strategy with strong generalization ability and reduce the cost of functional testing. The effectiveness of the proposed method is verified through a simulation case study