Characterization of Dielectric Materials at WM-380 Band (500 - 750 GHz) Using Three Broadband Measurement Techniques

This paper presents an interlaboratory comparison of three widely employed broadband dielectric measurement techniques in the terahertz region - namely, material characterization kit (MCK), conventional free-space method, and time domain spectroscopy (TDS). The comparison was undertaken within the WM-380 band (500-750 GHz), utilizing five common dielectric materials (ABS, HDPE, fused silica, YAG, and high-resistivity silicon). The results are discussed in detail, and generally good agreement in the extracted real part of the complex permittivity and loss tangent between these techniques is demonstrated.