Spectral Response of an Edge-on GaAsCr Detector for Clinical Photon Counting CT

This study introduces a novel edge-on structure X-ray detector based on GaAs:Cr, designed to enhance the spectral response of photon-counting detectors (PCDs) used in clinical applications. The GaAs:Cr detectors offer superior electron mobility and resistivity, contributing to a significant reduction in the pile-up effect and scattering when compared to face-on CZT and edge-on Si. These properties ensure a higher signal-to-noise ratio (SNR) and better energy resolution. To validate the performance of edge-on GaAs detector, we build a module with a specially engineered front-end amplification circuit, characterized by high gain and low noise.