KETEK’s Next Generation Analytical X-Ray Acquisition System AXAS 3.0

KETEK, the leading manufacturer of Silicon Drift Detectors, presents the next generation 3.0 electronics system. Key elements of the new platform are an optimized front-end electronics with excellent temperature stability, increased throughput capability and KETEK’s new, proprietary high-performance digital signal processor DPP 3.0. The modern AXAS 3.0 analytical x-ray acquisition system features all benefits of the new technology platform. It supports VITUS SDDs from $7 \mathrm{~mm}^{2}$ up to $50 \mathrm{~mm}^{2}$ collimated area, all equipped with KETEK’s outstanding first stage ultra-low noise charge sensitive amplifier CSA and KETEK’s proprietary CH- or CL-Graphene windows with excellent x-ray transmission from 0.1 keV (CL-type) upwards. The system has a very compact form factor of $80 \times 60 \times 36 \mathrm{~mm}^{3}$ and further provides two user interfaces (ethernet and USB) as well as a dedicated mapping mode for ultra-fast scanning of samples e.g. in SEM applications. Due to shortest DPP peaking times down to 25 ns, super-high input count rates up to 4 Mcps at less than 60% dead time yield in output count rates close to 2 Mcps. On the other side an excellent energy resolution down to 123 eV ($\mathrm{Mn} \mathrm{K} \alpha$-line) can be achieved at $1 \mu \mathrm{s}$ peaking time. We will present performance data, focusing on the specific needs of SEM and benchtop XRF applications.