A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits

It is demonstrated that in applying the FD-TD technique to analyze microwave integrated circuits, the long FD-TD time record required for generating accurate frequency domain scattering parameters can be extrapolated from a relatively short FD-TD time record by using Prony's method. As shown by comparison with the direct FD-TD generated results, the approach using the combination of FD-TD and Prony's methods achieves the same type of accuracy with a time record computed over a much shorter time.<
>