Relative intensity noise measurements in SRS microscope based on three femtosecond laser

The term “noise” pertaining to lasers refers to the random variations of several output characteristics, which are essential in numerous applications. The non-linear contrast efficiency and image quality in non-linear optical microscopy are influenced by the characteristics of the laser beam. Achieving optimal nonlinear optical imaging performance necessitates minimizing noise.In our previous work, the implementation of a femtosecond Stimulated Raman Scattering microscope equipped with three femtosecond laser sources was presented. In this article, we will explore the relative intensity noise (RIN) of three femtosecond laser sources. For our setup we employ a Ti:Sapphire (Ti:Sa) oscillator, a femtosecond synchronized optical parametric oscillator (OPO), and a second harmonic generator SHG. The RIN of all three-laser source are measured, and the results are discussed.