Thin-Film Resistance Standards with Calculable AC-DC Difference at Frequencies up to 2 MHz

We have developed novel 12.906 kΩ impedance standards based on series-connected thin-film resistors. The frequency dependence is calculable at frequencies up to a few megahertz and, due to the small thin-films dimensions, several orders of magnitude smaller than for all conventional calculable resistors at a comparable nominal value and smaller than the resolution of commercial precision LCR meters. The calculation and the experimental verification will be presented at the conference. In future, this will allow the calibration of precision LCR meters with an unmatched relative uncertainty of a few parts per million in the frequency range up to 2 MHz.