Measurement of Phase Angle Error of Reference Micropotentiometer Resistors

This paper presents preliminary results of phase angle error measurements of several radial thin-film micro-potentiometer resistors developed at the National Measurement Institute, Australia (NMIA). We explore the viability of using these resistors as references for phase error measurements of current shunts and precision resistors. The effects of common mode dependence and level dependence have been investigated. The measurements were made for a range of frequencies from 40 Hz to 100 kHz. Preliminary results demonstrate that the phase angle error of two resistors that are compared directly, and the sum of phase angle errors of two comparisons to a third resistor show agreement of better than 5 µrad.