Review of Selected Quantum Measurements Applied to Embedded Quantum Well in Nanoscale Transistor

The fabrication of nanoelectronic and nanophotonic devices based on embedded quantum structures has become feasible over the last decades, and the field is continuously improving. Quantum measurements describing evolving configurations are required as part of the optical characterization and performances study of these devices. To ensure accuracy, it is necessary to determine a reliable evaluation of the expected quantum effects relevant to both stationary and time-dependent measurements. Based on a case study of a quantum well embedded in a nanoelectronic MOSFET device as the gate-recessed channel (GRC), a set of possible quantum measurements that can serve as a basis to similar applications of the rules on additional devices is presented and analyzed.